Канал: Microscopy Australia

VIA Webinar: Deep learning denoising for volume microscopy

VIA Webinar: Deep learning denoising for volume microscopy

XPS course: 5. Acquisition of XPS Data

XPS course: 5. Acquisition of XPS Data

XPS course: 4. Sample Mounting into Flexi Lock Kratos Axis Supra Plus XPS

XPS course: 4. Sample Mounting into Flexi Lock Kratos Axis Supra Plus XPS

XPS course: 3. Sample Preparation for Xray Photoelectron Spectroscopy XPS

XPS course: 3. Sample Preparation for Xray Photoelectron Spectroscopy XPS

XPS course: 2. Components of the Kratos Axis Supra Plus XPS

XPS course: 2. Components of the Kratos Axis Supra Plus XPS

XPS course: 1. An Introduction to X-ray Photoelectron Spectroscopy

XPS course: 1. An Introduction to X-ray Photoelectron Spectroscopy

What is X ray CT?

What is X ray CT?

VIA webinar: Explore, annotate and analyse multidimensional images with Napari

VIA webinar: Explore, annotate and analyse multidimensional images with Napari

VIA Webinar: (Semi-) automated segmentation of biological images with Biomedisa and 3D Slicer

VIA Webinar: (Semi-) automated segmentation of biological images with Biomedisa and 3D Slicer

VIA Webinar: Volume Imaging with a Synchrotron – Now and in 10 years time

VIA Webinar: Volume Imaging with a Synchrotron – Now and in 10 years time

README Files for Microscopy Data

README Files for Microscopy Data

Directory Structures for Microscopy Data

Directory Structures for Microscopy Data

File Naming Convention in 7 STEPS: Worked Example for Biological Data

File Naming Convention in 7 STEPS: Worked Example for Biological Data

File Naming Conventions for Microscopy Images

File Naming Conventions for Microscopy Images

Why You Should Manage Your Microscopy Image Data

Why You Should Manage Your Microscopy Image Data

Insitu TEM Masterclass Lectures

Insitu TEM Masterclass Lectures

BYO Workshop: Introduction to ORS Dragonfly with Dr Denis Korneev

BYO Workshop: Introduction to ORS Dragonfly with Dr Denis Korneev

Assessing data quality in minutes – the near real time data capture revolution in microscopy

Assessing data quality in minutes – the near real time data capture revolution in microscopy

Data Management at the Centre for Microscopy, Characterisation and Analysis by Dr Emily Barker

Data Management at the Centre for Microscopy, Characterisation and Analysis by Dr Emily Barker

Increasing University wide Research Data Management maturity by Yvette Wharton and Laura Armstrong

Increasing University wide Research Data Management maturity by Yvette Wharton and Laura Armstrong

GBI EoE VII Impact and UN Sustainible Development Goals NIF and MA

GBI EoE VII Impact and UN Sustainible Development Goals NIF and MA

Video Rate Atomic Force Microscopy – Direct Visualization of Interfacial Nanostructure and Dynamics

Video Rate Atomic Force Microscopy – Direct Visualization of Interfacial Nanostructure and Dynamics

BYO Workshop: Introduction to IMOD presented by Dr Matthew Johnson

BYO Workshop: Introduction to IMOD presented by Dr Matthew Johnson

What does Microscopy Australia do?

What does Microscopy Australia do?

Pitschi Particle Image depoT using Storage Caching Infrastructure by Dr Rubbiya Ali and Dr Hoang Ngu

Pitschi Particle Image depoT using Storage Caching Infrastructure by Dr Rubbiya Ali and Dr Hoang Ngu

What is micro-CT?

What is micro-CT?

BYO Workshop: Visualising 3D data for Publication by Dr Ajay Limaye and Dr Jeremy Shaw

BYO Workshop: Visualising 3D data for Publication by Dr Ajay Limaye and Dr Jeremy Shaw

AARNet: Data movement as a service and GLOBUS for Australian research by Chris Myers and Ryan Fraser

AARNet: Data movement as a service and GLOBUS for Australian research by Chris Myers and Ryan Fraser

An introduction to Australian Access Federation (AAF) services including ORCID by Melroy Almeida

An introduction to Australian Access Federation (AAF) services including ORCID by Melroy Almeida

Principles of research data management for FAIRer microscopy presented by Dr David Poger

Principles of research data management for FAIRer microscopy presented by Dr David Poger

MyScope Simulator Launch: TEM, XRD & Light/Confocal

MyScope Simulator Launch: TEM, XRD & Light/Confocal

Basic Operation of the Hitachi SU3500 SEM

Basic Operation of the Hitachi SU3500 SEM

Tutorial: Re-orientation of 3D volumes in 3DSlicer by Dr Jeremy Shaw

Tutorial: Re-orientation of 3D volumes in 3DSlicer by Dr Jeremy Shaw

Tutorial: Re-orientation of 3D volumes in Avizo by Dr Jeremy Shaw

Tutorial: Re-orientation of 3D volumes in Avizo by Dr Jeremy Shaw

The Research Data Champion Program at Curtin University

The Research Data Champion Program at Curtin University

TEM as a Research Infrastructure in Europe by Prof. Rafal Dunin-Borkowski

TEM as a Research Infrastructure in Europe by Prof. Rafal Dunin-Borkowski

In Situ TEM Symposium hosted by the Electron Microscope Unit, MWAC UNSW

In Situ TEM Symposium hosted by the Electron Microscope Unit, MWAC UNSW

Persistent Identifiers for Research by Siobhann McCafferty from ARDC

Persistent Identifiers for Research by Siobhann McCafferty from ARDC

The Australian Characterisation Commons at Scale Project Update July 2021 by Dr David Poger

The Australian Characterisation Commons at Scale Project Update July 2021 by Dr David Poger

SEM: Hitachi TM4000Plus Benchtop SEM EDS Workflow

SEM: Hitachi TM4000Plus Benchtop SEM EDS Workflow

SEM: FEI Nova NanoSEM EDS Workflow

SEM: FEI Nova NanoSEM EDS Workflow

SEM: EDS Hitachi s3400 Workflow

SEM: EDS Hitachi s3400 Workflow

SEM: Hitachi s3400 SEM Workflow

SEM: Hitachi s3400 SEM Workflow

How Cryo-SEM helped WearOptimo

How Cryo-SEM helped WearOptimo

Why WearOptimo uses Microscopy Australia (short version)

Why WearOptimo uses Microscopy Australia (short version)

Why WearOptimo uses Microscopy Australia (full version)

Why WearOptimo uses Microscopy Australia (full version)

SEM: Hitachi TM4000Plus Benchtop SEM Workflow

SEM: Hitachi TM4000Plus Benchtop SEM Workflow

TEM: How to Vitrify a Cryo-TEM Sample Using the Leica EM Grid Plunger

TEM: How to Vitrify a Cryo-TEM Sample Using the Leica EM Grid Plunger

SEM: JEOL 7001F SEM Workflow

SEM: JEOL 7001F SEM Workflow

TEM: JEOL F200 Sample Loading and Holder Insertion

TEM: JEOL F200 Sample Loading and Holder Insertion

TEM: Alignment of the JEOL F200 TEM for High resolution Imaging

TEM: Alignment of the JEOL F200 TEM for High resolution Imaging

FIB: FEI Helios G4 PFIB cross section milling workflow

FIB: FEI Helios G4 PFIB cross section milling workflow

EBSD: EBSD data collection workflow

EBSD: EBSD data collection workflow

FIB: Easylift in situ lift out workflow

FIB: Easylift in situ lift out workflow

TEM: CM200 & Tecnai G2 20 – How to load a specimen into the single tilt holder

TEM: CM200 & Tecnai G2 20 – How to load a specimen into the single tilt holder

TEM: CM200 & Tecnai G2 20 – Inserting and removing the single tilt holder

TEM: CM200 & Tecnai G2 20 – Inserting and removing the single tilt holder

SEM: Carbon Coating Workflow

SEM: Carbon Coating Workflow

CryoTEM: Grid Clipping for Cryo TEM

CryoTEM: Grid Clipping for Cryo TEM

Sydney Microscopy Microanalysis Overview

Sydney Microscopy Microanalysis Overview

SEM: Zeiss Sigma HD Scanning Electron Microscope

SEM: Zeiss Sigma HD Scanning Electron Microscope

SEM: Zeiss EVO SEM EDS Part 3: Saving Data

SEM: Zeiss EVO SEM EDS Part 3: Saving Data

SEM: Zeiss EVO SEM EDS Part 2: Map

SEM: Zeiss EVO SEM EDS Part 2: Map

SEM: Zeiss EVO SEM EDS Part 1: Point & ID

SEM: Zeiss EVO SEM EDS Part 1: Point & ID

SEM: Zeiss EVO Scanning Electron Microscope

SEM: Zeiss EVO Scanning Electron Microscope

SEM: JEOL Neoscope Tabletop Scanning Electron Microscope

SEM: JEOL Neoscope Tabletop Scanning Electron Microscope

Light: Olympus FluoView FV3000 Confocal Microscope

Light: Olympus FluoView FV3000 Confocal Microscope

Light: Nikon NiE Fluorescence Microscope

Light: Nikon NiE Fluorescence Microscope

X-Ray Analysis in the SEM: Part 3 "Matrix Correction Procedures"

X-Ray Analysis in the SEM: Part 3 "Matrix Correction Procedures"

X-Ray Analysis in the SEM: Part 4 "X Ray Detectors"

X-Ray Analysis in the SEM: Part 4 "X Ray Detectors"

X-Ray Analysis in the SEM: Part 2 "X Ray Production"

X-Ray Analysis in the SEM: Part 2 "X Ray Production"

X-Ray Analysis in the SEM: Part 1 "Beam & Sample Interactions"

X-Ray Analysis in the SEM: Part 1 "Beam & Sample Interactions"

Rigaku SmartLab Bragg Brentano Measurement

Rigaku SmartLab Bragg Brentano Measurement

Applications and advantages of FIB SEM based ToF SIMS by Dr William Rickard

Applications and advantages of FIB SEM based ToF SIMS by Dr William Rickard

Introduction to Energy Dispersive X-Ray (EDXA) Microanalysis by Dr Frank Brink

Introduction to Energy Dispersive X-Ray (EDXA) Microanalysis by Dr Frank Brink

Introduction to Quantitative Evaluation of Minerals in the SEM (QEMSEM) by Dr Frank Brink

Introduction to Quantitative Evaluation of Minerals in the SEM (QEMSEM) by Dr Frank Brink

Intro to Light Microscopy 6: Digital Image & Data Analysis

Intro to Light Microscopy 6: Digital Image & Data Analysis

Intro to Light Microscopy 5: Fluorescence Microscopy Specimen and Imaging Tricks

Intro to Light Microscopy 5: Fluorescence Microscopy Specimen and Imaging Tricks

Intro to Light Microscopy 4: Sample Preparation and Artefacts

Intro to Light Microscopy 4: Sample Preparation and Artefacts

Intro to Light Microscopy 2: Principles of Fluorescence Microscopy

Intro to Light Microscopy 2: Principles of Fluorescence Microscopy

Intro to Light Microscopy 3: Actual Microscopes Part 3 – Advanced Microscopy Techniques

Intro to Light Microscopy 3: Actual Microscopes Part 3 – Advanced Microscopy Techniques

Intro to Light Microscopy 3: Actual Microscopes Part 1 – Widefield Fluorescence Microscopes

Intro to Light Microscopy 3: Actual Microscopes Part 1 – Widefield Fluorescence Microscopes

Intro to Light Microscopy 1: Microscopy Basics

Intro to Light Microscopy 1: Microscopy Basics

Intro to Light Microscopy 3: Actual Microscopes Part 2 – Confocal Microscopes

Intro to Light Microscopy 3: Actual Microscopes Part 2 – Confocal Microscopes

Introduction to Electron Probe X-Ray Microanalysis (EPMA) by Dr Jeff Chen

Introduction to Electron Probe X-Ray Microanalysis (EPMA) by Dr Jeff Chen

Beginner's Guide to Colouring Electron Microscope Images by Dr Jenny Whiting

Beginner's Guide to Colouring Electron Microscope Images by Dr Jenny Whiting

TEM: Sample insertion basics Tecnai F20

TEM: Sample insertion basics Tecnai F20

SEM: Sample Insertion Basics JEOL 890

SEM: Sample Insertion Basics JEOL 890

SEM: Sample Insertion Basics Philips XL30 SEM

SEM: Sample Insertion Basics Philips XL30 SEM

XPS: Data Processing

XPS: Data Processing

XPS: Introduction to X-Ray Photoelectron Spectroscopy

XPS: Introduction to X-Ray Photoelectron Spectroscopy

SEM Theory Course: Session 5 Specialised SEM Techniques

SEM Theory Course: Session 5 Specialised SEM Techniques

SEM Theory Course: Session 4 "How do I get a good image?"

SEM Theory Course: Session 4 "How do I get a good image?"

SEM Theory Course: Session 3 "How does a SEM work?"

SEM Theory Course: Session 3 "How does a SEM work?"

SEM Theory Course: Session 2 "What is Scanning Electron Microscopy?"

SEM Theory Course: Session 2 "What is Scanning Electron Microscopy?"

SEM Theory Course: Session 1 General Information

SEM Theory Course: Session 1 General Information

TEM: JEOL JEM-1400 TEM sample exchange procedure

TEM: JEOL JEM-1400 TEM sample exchange procedure

SEM: FEI Nova NanoSEM 450 Workflow

SEM: FEI Nova NanoSEM 450 Workflow

SEM: Sample prep – Quorum Q300T Sputter Coating Workflow

SEM: Sample prep – Quorum Q300T Sputter Coating Workflow

SEM: Sample Mounting for Nanoparticles or Particles in Suspension

SEM: Sample Mounting for Nanoparticles or Particles in Suspension

SEM: Sample Mounting for Powdered Samples

SEM: Sample Mounting for Powdered Samples

SEM: Sample Mounting for Bulk Samples

SEM: Sample Mounting for Bulk Samples

TEM: Transmission Electron Microscopy – Nanoparticle Sample Preparation and Demonstration

TEM: Transmission Electron Microscopy – Nanoparticle Sample Preparation and Demonstration

3D Data Visualisation with Avizo – Tutorial 1: Basics by Dr Jeremy Shaw

3D Data Visualisation with Avizo – Tutorial 1: Basics by Dr Jeremy Shaw

Introduction to MyScope – Webinar by Dr Jenny Whiting

Introduction to MyScope – Webinar by Dr Jenny Whiting

Stories & Structures – New Connections: Interview on Tjuma 96.3 FM

Stories & Structures – New Connections: Interview on Tjuma 96.3 FM

Dance Your PhD 2012 Winner - A super-alloy is born: the romantic revolution of lightness & strength

Dance Your PhD 2012 Winner - A super-alloy is born: the romantic revolution of lightness & strength

SEM sample prep: Bulk or powdered samples

SEM sample prep: Bulk or powdered samples

AFM: Aligning contact mode cantilever

AFM: Aligning contact mode cantilever

AFM: Tuning the cantilever

AFM: Tuning the cantilever

Ultramicrotomy: Mounting Water Boats

Ultramicrotomy: Mounting Water Boats

AFM: Scan Parameters

AFM: Scan Parameters

CryoSEM: Freezing Fresh Tissue in PreChamber

CryoSEM: Freezing Fresh Tissue in PreChamber

Ultramicrotomy: Making Glass Knives

Ultramicrotomy: Making Glass Knives

AFM: Overview of the Head

AFM: Overview of the Head

CryoSEM: Preparing the instrument

CryoSEM: Preparing the instrument

SEM: Mounting Bulk Samples

SEM: Mounting Bulk Samples

CryoSEM: Viewing sample subliming surface ice and sputter coating

CryoSEM: Viewing sample subliming surface ice and sputter coating

SEM: Mounting samples for EBSD

SEM: Mounting samples for EBSD

SEM: Sample Insertion Basics JEOL JSM 7001F SEM

SEM: Sample Insertion Basics JEOL JSM 7001F SEM

Ultramicrotomy: Obtaining Dry Thick Sections

Ultramicrotomy: Obtaining Dry Thick Sections

Ultramicrotomy: Mounting the knife and smoothing the block surface

Ultramicrotomy: Mounting the knife and smoothing the block surface

CryoSEM: Handling samples at LN2 temperatures

CryoSEM: Handling samples at LN2 temperatures

SEM: Sample Insertion Basics JEOL JSM 6610 SEM (LaB6)

SEM: Sample Insertion Basics JEOL JSM 6610 SEM (LaB6)

AFM: Changing scanners

AFM: Changing scanners

SEM: Mounting a Non-Conductive Sample

SEM: Mounting a Non-Conductive Sample

SEM: Critical Point Drying using Autosamdri-815 series A

SEM: Critical Point Drying using Autosamdri-815 series A

CryoSEM: Preparing and mounting a fresh sample

CryoSEM: Preparing and mounting a fresh sample

AFM: Cantilever approaching surface

AFM: Cantilever approaching surface

CryoSEM: Preparing a cross section from a fresh sample

CryoSEM: Preparing a cross section from a fresh sample

Ultramicrotomy: Creating sections on water using a smear of wax

Ultramicrotomy: Creating sections on water using a smear of wax

SEM: Carbon Coating Using Rods

SEM: Carbon Coating Using Rods

CryoSEM: Basic sample insertion techniques

CryoSEM: Basic sample insertion techniques

Ultramicrotomy: Using a 'Histo' Diamond Knife for Sectioning

Ultramicrotomy: Using a 'Histo' Diamond Knife for Sectioning

SEM: Mounting Conductive Samples

SEM: Mounting Conductive Samples

AFM: Aligning Laser – Maximising Signal on Cantilever

AFM: Aligning Laser – Maximising Signal on Cantilever

AFM: Artefacts in SPM Contact Mode

AFM: Artefacts in SPM Contact Mode

AFM: Post Processing – Flattening the image

AFM: Post Processing – Flattening the image

TEM: JEOL JEM 2010 Workflow

TEM: JEOL JEM 2010 Workflow

Ultramicrotomy: Cutting fresh sections a simple alternative to the hand microtome

Ultramicrotomy: Cutting fresh sections a simple alternative to the hand microtome

Ultramicrotomy: Hand Microtome Use

Ultramicrotomy: Hand Microtome Use

SEM: Sample Insertion Basics JEOL JSM 6300 SEM

SEM: Sample Insertion Basics JEOL JSM 6300 SEM

SEM: Sample Insertion Basics JEOL JSM 6460 LA

SEM: Sample Insertion Basics JEOL JSM 6460 LA

AFM: Loading Probe into the Tipholder

AFM: Loading Probe into the Tipholder

AFM: Laser Alignment

AFM: Laser Alignment

Ultramicrotomy: Introduction to Ultramicrotomy for TEM

Ultramicrotomy: Introduction to Ultramicrotomy for TEM

SEM: Mounting Powdered Samples

SEM: Mounting Powdered Samples

Ultramicrotomy: Mounting the Resin block

Ultramicrotomy: Mounting the Resin block

$CryoSEM: Preparing a fractured sample$

CryoSEM: Preparing a fractured sample

AFM: Sample Insertion

AFM: Sample Insertion

AFM: Mounting Samples for Atomic Force Microscopy

AFM: Mounting Samples for Atomic Force Microscopy

AFM: Shutdown

AFM: Shutdown

Ultramicrotomy: Thin Sections on a Water Bath

Ultramicrotomy: Thin Sections on a Water Bath

AFM: Tip Holder Insertion

AFM: Tip Holder Insertion

Ultramicrotomy: Tools used for Shaping Resin Blocks

Ultramicrotomy: Tools used for Shaping Resin Blocks

Ultramicrotomy: Trimming a Resin Block

Ultramicrotomy: Trimming a Resin Block

Ultamicrotomy: Using an Ultramicrotome to Trim a Resin Block

Ultamicrotomy: Using an Ultramicrotome to Trim a Resin Block