Канал: NI (now part of Emerson)

Sneak Peek at NI’s Latest DAQ Technology

Sneak Peek at NI’s Latest DAQ Technology

Join our exclusive product launch webinar!

Join our exclusive product launch webinar!

Introducing the Next Generation USB DAQ Device

Introducing the Next Generation USB DAQ Device

Thanks to everyone who joined us at #NIConnect 2024

Thanks to everyone who joined us at #NIConnect 2024

Test and Measurement Group President Ritu Favre | Introduction

Test and Measurement Group President Ritu Favre | Introduction

Analog Devices Michael O’Sullivan | Software is the Key to Standarization

Analog Devices Michael O’Sullivan | Software is the Key to Standarization

Michael Phillips, Shruti Shirhatti | Demos

Michael Phillips, Shruti Shirhatti | Demos

NI Connect 2024 Austin Highlights

NI Connect 2024 Austin Highlights

Matt Fangman | Microsoft

Matt Fangman | Microsoft

Kevin Schultz | Closing Remarks

Kevin Schultz | Closing Remarks

Kevin Schultz | Opening Remarks

Kevin Schultz | Opening Remarks

NI Connect 2024 Austin Highlights (Short)

NI Connect 2024 Austin Highlights (Short)

Siemens George Kaehler | Advantages of an Integrated Software and Hardware Approach

Siemens George Kaehler | Advantages of an Integrated Software and Hardware Approach

JKI Technologies Jim Kring | LabVIEW Communities

JKI Technologies Jim Kring | LabVIEW Communities

LightWheel AI Steve Xie | Importance of Data in the Era of AI

LightWheel AI Steve Xie | Importance of Data in the Era of AI

Magna International Lee Bauer | Future of Software-Defined Vehicles

Magna International Lee Bauer | Future of Software-Defined Vehicles

Raytheon Brian Hochheim | Scale System Deployment

Raytheon Brian Hochheim | Scale System Deployment

NI LabVIEW R&D | NI’s Commitment to LabVIEW

NI LabVIEW R&D | NI’s Commitment to LabVIEW

NI Connect 2024 recap!

NI Connect 2024 recap!

NI Connect 2024 Day 2 - Closing Keynote

NI Connect 2024 Day 2 - Closing Keynote

NI Connect 2024 Day 1 - Opening Keynote

NI Connect 2024 Day 1 - Opening Keynote

We've arrived in Austin for NI Connect 2024

We've arrived in Austin for NI Connect 2024

Subscribe to NI Apps

Subscribe to NI Apps

Join us for NI Connect Austin 2024

Join us for NI Connect Austin 2024

Allegro MicroSystems on Standardizing Test to Increase Efficiency

Allegro MicroSystems on Standardizing Test to Increase Efficiency

AI/ML Wireless Research with Northeastern University

AI/ML Wireless Research with Northeastern University

Unlock the power of test to engineer the future!

Unlock the power of test to engineer the future!

NI TestStand Song

NI TestStand Song

NI Connect 2023 Austin Highlights (Short)

NI Connect 2023 Austin Highlights (Short)

NI Connect 2023 Austin Highlights

NI Connect 2023 Austin Highlights

NI LabVIEW Song

NI LabVIEW Song

NI Connect: Software and Hardware Announcements

NI Connect: Software and Hardware Announcements

NI Connect 2023 Day 2 - Closing Keynote

NI Connect 2023 Day 2 - Closing Keynote

NI Connect 2023 Day 1 - Opening Keynote

NI Connect 2023 Day 1 - Opening Keynote

Join us for NI Connect Austin 2023

Join us for NI Connect Austin 2023

Test Standardization journey

Test Standardization journey

Why to move to model-based design approach

Why to move to model-based design approach

Partnership with NI

Partnership with NI

Designed to Perform - Product Data Strategy to Drive Business Outcomes

Designed to Perform - Product Data Strategy to Drive Business Outcomes

How test automation improves regulatory submissions in Medical devices

How test automation improves regulatory submissions in Medical devices

Why test standardization strategies are critical for medical device companies.

Why test standardization strategies are critical for medical device companies.

Manufacturing Trends in Medical Device Test

Manufacturing Trends in Medical Device Test

Students from TREL (Texas Rocket Engineering Lab) Discuss Their Plans to Send a Rocket to Space

Students from TREL (Texas Rocket Engineering Lab) Discuss Their Plans to Send a Rocket to Space

Thomas Benjamin, NI CTO, Discusses Some of the Technologies NI is Working On

Thomas Benjamin, NI CTO, Discusses Some of the Technologies NI is Working On

Thomas Benjamin, NI CTO, Discusses the Future of Test

Thomas Benjamin, NI CTO, Discusses the Future of Test

Samsung Using AI and ML in the Design of Next-Generation Wireless Networking Equipment

Samsung Using AI and ML in the Design of Next-Generation Wireless Networking Equipment

Nvidia Uses NI Optimal+ to Help Scale Manufacturing Capacity - with Arnold Suratos

Nvidia Uses NI Optimal+ to Help Scale Manufacturing Capacity - with Arnold Suratos

Using NI technology to Ensure Mission Readiness for Launch Vehicles - Firefly Aerospace and Tech180

Using NI technology to Ensure Mission Readiness for Launch Vehicles - Firefly Aerospace and Tech180

Improving Test Systems for Fire Alarms - with Paul Kilbridge and Joe Daly from Ei

Improving Test Systems for Fire Alarms - with Paul Kilbridge and Joe Daly from Ei

Using ActiveUptime to Closely Monitor Large Test Systems - with Michael Trumm

Using ActiveUptime to Closely Monitor Large Test Systems - with Michael Trumm

Qualcomm Works with NI to Test Next-Generation Wireless Technology – with Gaurav Verma

Qualcomm Works with NI to Test Next-Generation Wireless Technology – with Gaurav Verma

Advanced Radar and EW capabilities Demonstration - with Haydn Nelson and Dave Kirk

Advanced Radar and EW capabilities Demonstration - with Haydn Nelson and Dave Kirk

Making the Air Force of the Future - with Dr. Howard Meyer

Making the Air Force of the Future - with Dr. Howard Meyer

NI CEO Eric Starkloff - The British Cycling Team and how it relates to data and performance

NI CEO Eric Starkloff - The British Cycling Team and how it relates to data and performance

GM works with NI to Test EV Batteries in their Ultium Platform – with Steve Tarnowsky

GM works with NI to Test EV Batteries in their Ultium Platform – with Steve Tarnowsky

NI Connect Munich Highlights (Short)

NI Connect Munich Highlights (Short)

Jaguar Land Rover works with NI and Seagate to better use their data when testing ADAS systems

Jaguar Land Rover works with NI and Seagate to better use their data when testing ADAS systems

HENSOLDT uses SystemLink™ software to help increase first pass yield from 40% to 95%

HENSOLDT uses SystemLink™ software to help increase first pass yield from 40% to 95%

Northvolt aims to make the greenest automotive battery with help from NI

Northvolt aims to make the greenest automotive battery with help from NI

Electrolux standardizes on NI technology to increase quality and reduce cost

Electrolux standardizes on NI technology to increase quality and reduce cost

ams OSRAM standardizes on LabVIEW, Python, and PXI to increase efficiency

ams OSRAM standardizes on LabVIEW, Python, and PXI to increase efficiency

NI Connect 2022 Munich Highlights

NI Connect 2022 Munich Highlights

NI Connect Munich 2022 I Keynote

NI Connect Munich 2022 I Keynote

Assisted and Automated Driving at Jaguar Land Rover powered by NI

Assisted and Automated Driving at Jaguar Land Rover powered by NI

Digital transformation at Ei Electronics

Digital transformation at Ei Electronics

Test standardization across manufacturing at Ei Electronics

Test standardization across manufacturing at Ei Electronics

Design cycle standardization at Ei Electronics

Design cycle standardization at Ei Electronics

Automated validation test at Ei Electronics

Automated validation test at Ei Electronics

Introduction to Test Standardization at Ei Electronics

Introduction to Test Standardization at Ei Electronics

Defense Aircraft Test Challenges: Engine Test with NI and Rolls-Royce

Defense Aircraft Test Challenges: Engine Test with NI and Rolls-Royce

Defense Aircraft Test Challenges: Electro-optic and Infrared Systems with NI and Viewpoint Systems

Defense Aircraft Test Challenges: Electro-optic and Infrared Systems with NI and Viewpoint Systems

Defense Aircraft Test Challenges: LRU Hardware-in-the-Loop Systems with NI and Tech180

Defense Aircraft Test Challenges: LRU Hardware-in-the-Loop Systems with NI and Tech180

NI Connect 2022 Austin Highlights

NI Connect 2022 Austin Highlights

The Key to More Efficient Performance is in Your Test Data & Analytics

The Key to More Efficient Performance is in Your Test Data & Analytics

NI Connect: Hardware Announcements

NI Connect: Hardware Announcements

NI Connect: Software Announcements

NI Connect: Software Announcements

NI Connect 2022 Austin | Closing Keynote

NI Connect 2022 Austin | Closing Keynote

NI Connect 2022 Austin | Tuesday Afternoon Keynote

NI Connect 2022 Austin | Tuesday Afternoon Keynote

NI Connect 2022 Austin | Opening Keynote

NI Connect 2022 Austin | Opening Keynote

NI Connect Austin | Conference Party Drone Show

NI Connect Austin | Conference Party Drone Show

How it Started, and How It’s Going (Engineering Podcast: Testing 1, 2, 3)

How it Started, and How It’s Going (Engineering Podcast: Testing 1, 2, 3)

How Tech Changes Lives (Engineering Podcast: Testing 1, 2, 3)

How Tech Changes Lives (Engineering Podcast: Testing 1, 2, 3)

Who Tests the Test? (Engineering Podcast: Testing 1, 2, 3)

Who Tests the Test? (Engineering Podcast: Testing 1, 2, 3)

The Future of Mobility (Engineering Podcast: Testing 1, 2, 3)

The Future of Mobility (Engineering Podcast: Testing 1, 2, 3)

Big Data (Engineering Podcast: Testing 1, 2, 3)

Big Data (Engineering Podcast: Testing 1, 2, 3)

Test Talk: Can Test Eliminate Electric Vehicle Range Anxiety?

Test Talk: Can Test Eliminate Electric Vehicle Range Anxiety?

Shortened EV Development Cycle Using NI and AVL Virtual Testing Solution

Shortened EV Development Cycle Using NI and AVL Virtual Testing Solution

5G Is Not For You (Engineering Podcast: Testing 1, 2, 3)

5G Is Not For You (Engineering Podcast: Testing 1, 2, 3)

On the Ground at OmniAir Plugfest 2021

On the Ground at OmniAir Plugfest 2021

How to Lose $50M in 50 Seconds (Engineering Podcast: Testing 1, 2, 3)

How to Lose $50M in 50 Seconds (Engineering Podcast: Testing 1, 2, 3)

Where is my Self-Driving Car? (Engineering Podcast: Testing 1, 2, 3)

Where is my Self-Driving Car? (Engineering Podcast: Testing 1, 2, 3)

Test Talk: Focus on Systems, Data, and Process to Eliminate Bottlenecks

Test Talk: Focus on Systems, Data, and Process to Eliminate Bottlenecks

How We Got Here: The Importance of Test Technology (Engineering Podcast: Testing 1, 2, 3)

How We Got Here: The Importance of Test Technology (Engineering Podcast: Testing 1, 2, 3)

7 Ways to Make Your Test Strategy a Differentiator

7 Ways to Make Your Test Strategy a Differentiator

Test Talk: Predictive Maintenance is a Data-Driven Crystal Ball

Test Talk: Predictive Maintenance is a Data-Driven Crystal Ball

Test Talk: Is Simulation the End of Physical Testing?

Test Talk: Is Simulation the End of Physical Testing?

6G: Exploring Sub-THz Frequencies

6G: Exploring Sub-THz Frequencies

Unscripted with Ted Rappaport

Unscripted with Ted Rappaport

6G: Joint Comms & Sensing with Barkhausen Institute

6G: Joint Comms & Sensing with Barkhausen Institute

Test Talks: Connecting the Digital Thread of Data

Test Talks: Connecting the Digital Thread of Data

NI Connect: The Evolution of Autonomous Systems

NI Connect: The Evolution of Autonomous Systems

NI Connect: Digital Transformation in the Age of Rapid Innovation

NI Connect: Digital Transformation in the Age of Rapid Innovation

NI Connect: The Future of Cellular Communications

NI Connect: The Future of Cellular Communications

NI Connect: Beyond the PC - The Evolution of Test and Measurement Processing

NI Connect: Beyond the PC - The Evolution of Test and Measurement Processing

6G: An Introduction with Dr. Gerhard Fettweis (Part 1/2)

6G: An Introduction with Dr. Gerhard Fettweis (Part 1/2)

6G: An Introduction with Dr. Gerhard Fettweis (Part 2/2)

6G: An Introduction with Dr. Gerhard Fettweis (Part 2/2)

NI Connect: The Highlights

NI Connect: The Highlights

Go Beyond Test: Harness Insights that Drive Powerful Outcomes

Go Beyond Test: Harness Insights that Drive Powerful Outcomes

Test Talks: From 1G to 6G – The Evolution of Wireless Communication

Test Talks: From 1G to 6G – The Evolution of Wireless Communication

The Industrial Internet of Things – Centralized Management of Edge Nodes with Blue Origin

The Industrial Internet of Things – Centralized Management of Edge Nodes with Blue Origin

Rethinking Test – Transform Your Approach to Ensure Product Performance

Rethinking Test – Transform Your Approach to Ensure Product Performance

Introducing the NI Ettus USRP X410 with 3dB Labs Sceptre

Introducing the NI Ettus USRP X410 with 3dB Labs Sceptre

Test Talks: Why Autonomous Vehicles are Failing

Test Talks: Why Autonomous Vehicles are Failing

NI Automotive Pulse: Accelerating the Path to Vision Zero

NI Automotive Pulse: Accelerating the Path to Vision Zero

Generation NI

Generation NI

No Shortcuts to Vision Zero

No Shortcuts to Vision Zero

Secrets of Small - Solubit

Secrets of Small - Solubit

Secrets of Small - Viviota

Secrets of Small - Viviota

Secrets of Small - Noffz

Secrets of Small - Noffz

Secrets of small - Hiller Measurements

Secrets of small - Hiller Measurements

The benefits of learning from failure - Hiller Measurements

The benefits of learning from failure - Hiller Measurements

The role of failure in making things better - Noffz

The role of failure in making things better - Noffz

The process of using planned and unplanned failure to get to success - Viviota

The process of using planned and unplanned failure to get to success - Viviota

Learning from failure to make improvements - Solubit

Learning from failure to make improvements - Solubit

Product Lifecycle Analytics Solutions

Product Lifecycle Analytics Solutions

Wideband RF-Power Amplifier Validation and Linearization with Digital Predistortion

Wideband RF-Power Amplifier Validation and Linearization with Digital Predistortion

Unscripted with Alyssa Carson, Future Astronaut and Space Enthusiast

Unscripted with Alyssa Carson, Future Astronaut and Space Enthusiast

Wafer Level Reliability (WLR) Software 21.0: Enhance Reliability Throughput with WLR Software & SMUs

Wafer Level Reliability (WLR) Software 21.0: Enhance Reliability Throughput with WLR Software & SMUs

Radar Target Generation for System-Level Validation

Radar Target Generation for System-Level Validation

Radar Jamming - NI Radar Series #5

Radar Jamming - NI Radar Series #5

How to Test a Radar - NI Radar Series #3

How to Test a Radar - NI Radar Series #3

How to Steer a Radar - NI Radar Series #4

How to Steer a Radar - NI Radar Series #4

Cognitive Radar - NI Radar Series #2

Cognitive Radar - NI Radar Series #2

How Does Radar Work? - NI Radar Series #1

How Does Radar Work? - NI Radar Series #1

Unscripted with Shellye Archambeau: Being Unapologetically Ambitious

Unscripted with Shellye Archambeau: Being Unapologetically Ambitious

Parallel Functional Test with the ECU Test System

Parallel Functional Test with the ECU Test System

Simplified Maintenance with the ECU Test System

Simplified Maintenance with the ECU Test System

Seat Heater Validation with FlexLogger

Seat Heater Validation with FlexLogger

Automotive Brake Validation with FlexLogger

Automotive Brake Validation with FlexLogger

Power Seat Validation with Flexlogger

Power Seat Validation with Flexlogger

Unscripted: The Future of Automotive with Richard Sear

Unscripted: The Future of Automotive with Richard Sear

Unscripted: Microsoft's Jacky Wright Talks Digital Transformation

Unscripted: Microsoft's Jacky Wright Talks Digital Transformation

Unscripted: Keith Ferrazzi, Bestselling Author and Coach, Talks Co-Elevation

Unscripted: Keith Ferrazzi, Bestselling Author and Coach, Talks Co-Elevation

Unscripted: Anthony Scriffignano Talks Artificial Intelligence

Unscripted: Anthony Scriffignano Talks Artificial Intelligence

Taking an automated power measurement on a printed circuit board (PCB)

Taking an automated power measurement on a printed circuit board (PCB)

Testing ARINC 818 and Other High-Speed Avionics Buses with NI and New Wave DV

Testing ARINC 818 and Other High-Speed Avionics Buses with NI and New Wave DV

Wafer Level Reliability: Enhance your reliability decisions with interactive WLR software & SMUs

Wafer Level Reliability: Enhance your reliability decisions with interactive WLR software & SMUs

NI Acoustic Functional Test Station for Digital Microphone Test

NI Acoustic Functional Test Station for Digital Microphone Test

NI 5G NR Test UE Software Overview

NI 5G NR Test UE Software Overview

NI 5G NR Test UE Hardware Overview

NI 5G NR Test UE Hardware Overview

EV and Hybrid Vehicle HIL Testing - Part 2

EV and Hybrid Vehicle HIL Testing - Part 2

EV and Hybrid Vehicle HIL Testing - Part 1

EV and Hybrid Vehicle HIL Testing - Part 1

Battery Test System Software Overview

Battery Test System Software Overview

Automotive radar test for testing the vehicles of tomorrow, today with NI VRTS

Automotive radar test for testing the vehicles of tomorrow, today with NI VRTS

5G mmWave Over-the-air (OTA) Validation solution with Compact Antenna Test Range

5G mmWave Over-the-air (OTA) Validation solution with Compact Antenna Test Range

ECU Test System in Action

ECU Test System in Action

Body ECU HIL: Test at the Pace of Innovation

Body ECU HIL: Test at the Pace of Innovation

HIL Model Integration with VeriStand

HIL Model Integration with VeriStand

5G NewRadio (or NR) Power Amplifier Characterization with NI RFIC Test Software

5G NewRadio (or NR) Power Amplifier Characterization with NI RFIC Test Software

Testing Medical Devices: A discussion with Chris Robinson of Medtronic

Testing Medical Devices: A discussion with Chris Robinson of Medtronic

Virtual Panel Critical Productivity and Remote Access

Virtual Panel Critical Productivity and Remote Access

Engineering Refined: Engineering. Ambition. You.

Engineering Refined: Engineering. Ambition. You.

It’s time. Let’s Engineer Ambitiously.™

It’s time. Let’s Engineer Ambitiously.™

Engineer Ambitiously ™

Engineer Ambitiously ™

Modern Lab: Maximize Efficiency and Accelerate Semiconductor Validation

Modern Lab: Maximize Efficiency and Accelerate Semiconductor Validation

Engineering from Home: Ren on Convertible Desks, Work Uniforms, and Seamless Transitions

Engineering from Home: Ren on Convertible Desks, Work Uniforms, and Seamless Transitions

Engineering from Home: Maxim on Sharing Space, DIY Desks, and Befriending Appliances

Engineering from Home: Maxim on Sharing Space, DIY Desks, and Befriending Appliances

Bridge Semiconductor Design to Test through a Data Platform

Bridge Semiconductor Design to Test through a Data Platform

Engineering from Home: Mikhail on RF Hardware, Power Consumption, and Staying FLEXible.

Engineering from Home: Mikhail on RF Hardware, Power Consumption, and Staying FLEXible.

Engineering From Home: Graham on Technical Content, Lunch, and Darts

Engineering From Home: Graham on Technical Content, Lunch, and Darts

Engineering From Home: Haydn on Hardware Demos and Guitar Collections

Engineering From Home: Haydn on Hardware Demos and Guitar Collections

Engineering From Home: Tanja on Remote Hardware Configuration and Alternative Desks

Engineering From Home: Tanja on Remote Hardware Configuration and Alternative Desks

Engineering From Home: Darin on Productivity, Whiteboarding, and Appropriate Footwear

Engineering From Home: Darin on Productivity, Whiteboarding, and Appropriate Footwear

NI Fast 5G mmWave Over-the-Air (OTA) Validation Test Solution

NI Fast 5G mmWave Over-the-Air (OTA) Validation Test Solution

Logging and Reviewing Data in FlexLogger

Logging and Reviewing Data in FlexLogger

Building FlexLogger Screens to Visualize Live Data

Building FlexLogger Screens to Visualize Live Data

Configuring Events in FlexLogger

Configuring Events in FlexLogger

Configuring Alarms and Calculations in FlexLogger

Configuring Alarms and Calculations in FlexLogger

Configuring Hardware I/O Channels in FlexLogger

Configuring Hardware I/O Channels in FlexLogger

Introduction to FlexLogger

Introduction to FlexLogger

Creating Automated Test Systems - Video 4 - Software

Creating Automated Test Systems - Video 4 - Software

Creating Automated Test Systems - Video 3 - Fixtures

Creating Automated Test Systems - Video 3 - Fixtures

Creating Automated Test Systems - Video 2 - Test Hardware

Creating Automated Test Systems - Video 2 - Test Hardware

Creating Automated Test Systems - Video 1 - Introduction

Creating Automated Test Systems - Video 1 - Introduction

Creating Automated Test Systems - Video 5 - Operations

Creating Automated Test Systems - Video 5 - Operations

Introduction to the TestStand Simple User Interface Code in LabVIEW

Introduction to the TestStand Simple User Interface Code in LabVIEW

Disabling the UI buttons in the TestStand Operator Interface with LabVIEW

Disabling the UI buttons in the TestStand Operator Interface with LabVIEW

Getting Started with LabVIEW for NI ELVIS

Getting Started with LabVIEW for NI ELVIS

Starting a LabVIEW Project for NI ELVIS III

Starting a LabVIEW Project for NI ELVIS III

Getting Started with NI ELVIS III

Getting Started with NI ELVIS III

Installing the NI ELVIS III Drivers & Application Toolkit for LabVIEW

Installing the NI ELVIS III Drivers & Application Toolkit for LabVIEW

Connecting to NI ELVIS III with LabVIEW

Connecting to NI ELVIS III with LabVIEW

LG&E and KU Energy monitors systems with InsightCM

LG&E and KU Energy monitors systems with InsightCM

Hands-on Engineering at the Oklahoma State University Endeavor Facility

Hands-on Engineering at the Oklahoma State University Endeavor Facility

What is the NI Semiconductor Test System (STS)?

What is the NI Semiconductor Test System (STS)?

Texas Instruments Analog Electronics Board First Look

Texas Instruments Analog Electronics Board First Look

ATE Germany: Automated EV Battery Pack Test Demo

ATE Germany: Automated EV Battery Pack Test Demo

NI and MathWorks: Collaborating to accelerate engineering productivity

NI and MathWorks: Collaborating to accelerate engineering productivity

Butterfly Network Uses NI Semiconductor Test System to Test Revolutionary Ultrasound-on-a-Chip

Butterfly Network Uses NI Semiconductor Test System to Test Revolutionary Ultrasound-on-a-Chip

Accelerating 5G Semiconductor Test with the NI mmWave Vector Signal Transceiver

Accelerating 5G Semiconductor Test with the NI mmWave Vector Signal Transceiver