The Panther inspection instrument by Eddyfi Technologies can handle various types of phased array probes, including linear, matrix, and sector annular arrays. It can manage both single and dual element probes, as well as more complex ones. Operators can download a text file that describes the distribution of the probe elements, which can have different shapes (rectangular, circular, triangular, hexagonal), dimensions, locations, and orientations.

In this example, we are using a 128-element sparse array with a specific element distribution. The Panther can calculate delay laws for standard phased array operations like linear scanning, sectorial scanning, and compound scanning. It can also calculate total focusing images (TFM) from a full matrix capture of plane wave imaging. In this case, we are calculating a TFM image parallel to the sample surface. We can easily adjust the altitude and orientation of the TFM.

The sample being examined has flat bottom holes at different depths. We can adjust the TFM area to match the length of the holes precisely. The live TFM image shows the results. To account for the different depths of the holes, we are using a multi-group configuration with three TFM images. Each TFM is sensitive to different flat-bottomed holes. The Panther performs a full matrix capture using 128-element probes, transferring close to 16,000 signals for each TFM and a total of 50,000 signals for the entire multi-group configuration.

In this video, we demonstrate a complex application using a Panther equipped with a 10 Gigabit Ethernet connection and a 2D sparse array. We import a 3D CAD file and calculate three high-resolution horizontal TFM images in a multi-group configuration.

For more information visit eddyfi.com/panther-2.

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