Discover how our SENTIO® Software Suite and MPI Probe Hover Control™ feature make wafer testing easy and efficient. In this live demo, our engineer showcases the simplicity of the software, including the intuitive interface and customizable macros. Watch as we demonstrate how the MPI Probe Hover Control™ feature ensures smooth and accurate contact with the wafer, ensuring precise and reliable testing. Our SENTIO® Software Suite is designed to provide users with comprehensive technical support and integrated data analysis tools, ensuring optimal testing efficiency. Don't miss this demo! Watch now to see how the SENTIO® Software Suite and MPI Probe Hover Control™ feature can streamline your testing process.
Keywords: SENTIO® Software Suite, MPI Probe Hover Control™, wafer testing, intuitive interface, customizable macros, technical support, integrated data analysis, testing efficiency.
