Dive into the advanced capabilities of the HD-KFM mode on the Nano-Observer AFM! This video showcases sample scan results of graphene and MoS2, demonstrating the powerful combination of Kelvin Probe Microscopy and Magnetic Force Microscopy.

Witness the precision and clarity of surface potential signals over an 8µm area, measured with a 100x100x12μm scanner. Whether you are a seasoned researcher or new to AFM technology, this video provides valuable insights into the enhanced imaging and analysis made possible with the HD-KFM mode.

🔹 Key Highlights:

Sample scans of graphene and MoS2
Combined Kelvin Probe and Magnetic Force Microscopy
High-definition surface potential signals
Utilizes a 100μm scanner with 12μm z range
Unlock new potential in your materials research with the HD-KFM mode on the Nano-Observer AFM. Watch now to see the future of nanotechnology in action!

👉 Learn more at csiafm.com
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